Sample_data/afm/ — Atomic Force Microscopy

← Back to Sample Data

One AFM topography scan stored in Bruker SPM (.spm) format:

  • example_file.spm — Surface topography measurement of a thin-film electrode material. The file is loaded via load_data() in the io_afm1 and io_afm2 notebooks, which demonstrate height-channel extraction and normalisation.

Note

Loading .spm files requires the pySPM package, which is part of JuSPICE’s core install — see Installation.

Modality: Atomic Force Microscopy (AFM)
Used by: io_afm1, io_afm2
Data provided by: Dr. Julian Borowec

See also