Atomic Force Microscopy (AFM)

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AFM rasters a sharp tip over the surface and measures tip–sample forces [5].

• Resolution: sub-nanometre in height; lateral resolution depends on tip radius (typically 5–30 nm).

• Imaging modes:

  • Contact mode: constant force; risk of sample damage.

  • Tapping/AC mode: oscillating tip; gentler; most common.

  • Peak-force QNM: maps mechanical properties simultaneously.

• Applications: solid-electrolyte-interphase (SEI) layer growth, surface roughness, particle deformation, in-situ/operando measurements.

• Challenges: slow scan speed, tip convolution artifacts, drift, vibration sensitivity.

See also

• Temporal / In-Situ and Operando Imaging — repeating any technique over time, as AFM often does for SEI growth

• Key Imaging Techniques — every other imaging technique