Key Imaging Techniques

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Pick a technique below.

Scanning Electron Microscopy (SEM)

Surface topography and compositional contrast from a rastered electron beam.

Transmission Electron Microscopy (TEM)

Atomic-resolution structure from a beam transmitted through a thin sample.

Atomic Force Microscopy (AFM)

Surface topography and mechanical properties from tip–sample forces.

Spectroscopy, Tomography, and Other Techniques

EDX/EDS, EBSD, X-ray and FIB tomography — composition and 3D structure.

Temporal / In-Situ and Operando Imaging

Repeating any technique over time to capture a process as it happens.